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Optical semiconductor prober

Optical semiconductor prober

This is a device for probing and measuring/testing surface-emitting lasers (VCSEL) and photodiodes (PD/APD) in wafer form. ■ VCSEL - I-L-V measurement - V-I measurement - Wavelength measurement - High-frequency characteristics ■ PD/APD - V-I measurement (dark current, photocurrent) - High-frequency characteristics ■ Features - Peak search function for optical axis alignment - Back contact compatible with flip chips - Measurement items and content can be customized in the software to meet customer specifications.